DIP-View is a pioneer in high-resolution deflectometry for surface analysis and measurement.
Transfer project
The need to develop a D-Surface View-type instrument (now marketed by the start-up) was initially identified as part of a market study subcontracted by TTT. Our SATT (a French technology transfer acceleration company) then invested in a technical programme to develop the technology in line with the identified need, and patented the invention. We were also involved in the ‘creation support’ aspect: identification of a CEO profile, work on the constitution/cohesion of the team.
Development
The technology was developed by the Laboratoire d'Analyse et d'Architecture des Systèmes.
The company
Dip-VIEW offers high-resolution deflectometry equipment for surface analysis with very high measurement dynamics (from nm to mm in a single shot), for off-line quality control and on-line inspection applications in a wide range of sectors (automotive, semiconductors, optics, etc.).